•Die size Estimation
•Macro placement Guidelines
•Measures to be taken to have good floorplan
Powerplan
•Creation of Power Grid
•Robustness of Power grid
•IR analysis
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Agenda
FLOORPLAN & Data Setup
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Objectives of floorplan
Minimize the die size
Meet the timing requirements
Power routing should meet the IR/EM targets
maximize the routability
minimize the delays
Decides the area for standard cell
Routing complications are reduced by good floorplanning.
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What is Floorplanning ?
•Floorplanning is the process of deciding the die size, proper placement of the IO’s ,
macros (PLL , PHY etc. ) and memories and Power routing the design to meet the
requirements of the specification.
•Good floorplan would reduce the no. of iterations during the Design/Timing closure
•Require lots of manual intervention during this stage.
•This is the first step towards the Design of chip.
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Place Macro & Memories
Add halo
Add Tap cells
Create proper Blockages
Able to Create proper power mesh
Pin Placement
Signal/Power Pad Placement
Die Size Estimation - Factors
Total Die Area comprises -
•Core Area
1. Standard cell area – Total area of all modules in the design and area of all
buffers added for timing fixes.
2. Memory area
3. Analog Macros area
IO Area
1. Total no of Signal Pads
2. Total no of Power Pads
Aspect Ratio
•Aspect Ratio = Height/width
•Decide the aspect ratio based on the available horizontal & vertical routing
tracks.
Utilization: Should be less than 70%
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Design can become -
1. Core limited Design
–The size of the chip is decided based on the size of the core region (logic). The number of pads are
less, so that the pads can be placed around the core.
2. Pad Limited Design
–Size of the chip is decided based on the No. of pads, because the core region is very small.
The size of the die is decided based on the below factors
–Core Limited/Pad Limited Die
–Number of IO’s
–Area of the standard cells
–Macro area
Die Size Estimation
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Standard cells
Memories
Input / Output buffers
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Floor Planning
Top Level View
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•Blockages can also be
added in the floorplan to
prohibit standards cells
from being placed in those
areas
Floor plan
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Macro placement
➢ Macro should be place near to the boundary.
➢ Macro should be place according to their hierarchy
➢ Macro channel space should be proper
➢ Macro stacking should be limited
➢ Macro pins should be accessible
➢ Macro pins orientation should correct or towards the
core
➢ Maximum space for the standard cell and routing
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Floorplan checks
●No floating pin should be there.
●There should be open connection.
●Channel should not narrow.
●Timing should be meet.
●Delay should be minimum.
Hierarchical Design
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•Flat Floorplan Design:
•• It support optimization across functional boundaries
resulting in smaller,faster
•chips
•• This design easily maps with todays flat place and route
technologies
•• It requires EDA tools to support high capacity
•• Does not help scope with the complexity
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Flat Design
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Power Planning
1. To distribute the power from power pads to all elements
of the chip.
2. Unified supply of power with less voltage drop.
3. A proper Power design should aim at using as less
routing resources as possible.
4. Power Analysis checks (IR/EM) should be done after
power planning is Completed
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Objectives of Power Routing
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Power Estimation
●Power estimation is based on total power consumed by
the chip
Power Estimation includes –
Core Power
Memory/Macro Power
IO Power
Core Power = Combinational logic Power + Sequential + Clock Power
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Power Plan Inputs
●Floorplan Netlist(.v)
●SDC(.sdc)
●LIB(.lib)
●LEF(.lef)
●TECH FILE(.tech)
●TLU(.tlu)
•Switching power
•Power dissipated due to standard cell, pads and macros charging and
discharging the
•output load(interconnect+fanout loads)
•Internal power
•Power dissipated due to cell internal loads and short circuit current
•Short circuit current , current flowing from Vdd to vss when both PMOS
and NMOS are
•completely/partially on
•Leakage power
•Due to leakage current in MOS
•Designs can have as high as 40% leakage contributions
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Types of power
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Power Planning
•Power Planning includes proper
estimation of power of chip and
power routing the design based on
the estimation.
•In the power planning we create a
mesh kind of structure. So that
instance can take direct supply
from the nearest cell
•In the power planning we create
multiple VDD and VSS lines
1. To distribute the power from power pads/pins to all elements of the chip.
2. Uniformly distribute power with less voltage drop.
3. For meet IR/EM targets
4. Reducing delay
5. For meet timing requirement
➢ Sometime its happened that many instantaneous are switch from 0 to 1 at the same
time, that time they required a huge amount of current so in this scenario this mesh kind
of structure is very helpful
Why create mesh kind of structure
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Standard cells
Memories
Input / Output buffers
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Std cell rows : the rows on which std cells are placed are
called as std cell rows
Std cells height is fixed for certain technology
Power rails (sometimes called row straps or standard cell
preroutes), straps, and trunks
cross the entire die or sections of the die. The horizontal
wires are often referred to as
rails while the vertical wires are referred to as straps
Tracks are defined for metal routing
Rows are defined for std cell routing.
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Power planning issues
●IR Drop
●Ground bounce
●EM violations
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IR Drop
Reduction in voltage that occurs on power supply networks (VDD)
IC design expects availability of ideal power supply
In reality, localized voltage drops within the power grid
Increasing current/area on die
Narrower metal line widths (increases power grid resistance)
Results in decreased power supply voltage at cells/transistors
Decreases the operating voltage of the chip, resulting in timing and functional failures
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Ground Bounce
Increase in voltage that occurs on ground networks (VSS or GND) in integrated circuits
Increase in ground voltage decreases the operating voltage of the chip, resulting in timing and
functional problems
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Em violations
●When metal density increase beyond the limit,the
electrons starts move with high velocity and strikes from
the atoms and atom release get more free.and this
electrons and strike to the other atom.so mass flux is
induced in oppsite direction of current.
●As a results metal get open/shots.
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Reasons of IR Drop
●Power structure is not proper.
●Cell density is very high.
●Instance are not get proper power because of no straps
over there
●Mesh structure is proper but there is no via.
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How to reduce IR drop
●Routing should be from top layer.
●By adding some more power stripes
●By increasing the width of the metal.
●By adding Decaps.
●By using some low power techniques
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Reasons and Solution of EM violation
•Reasons of EM violation :-
Narrow metal width
Metal slotting
•Solution
–By increase Metal width
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●
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Power plan checks
●There should be no open connection
●All the macros should be hooked up.
●IR/EM target should be meet.
●Missing via should be taken care
●There should be no hot shots.
Wire Bonding And Flip Chip
Wires and Solder Balls
IR drop
In Wire Bond In Flip chip
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1.Tech File
2.TLU +
3.IO TDF file
4.Netlist
5.SDC
1.IO pads placed
2.Chip/core boundary
3.Cell rows, wire tracks
created
4.Macro placement final
Output
place_opt
clock_opt
route_opt
Chip finishing and DFM
Power plan
1.Std cells placed
2.Clock tree(s) built
3.Clock and signal
routing completed
Output
Floorplan
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IC Compiler Data Flow
DEF
MW
Design
Planning