MOSFET: Principles, Device Physics, Operation & Applications (A Comprehensive Lecture by Dr. G. S. Virdi, Ex-Chief Scientist, CSIR-CEERI Pilani)
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Oct 29, 2025
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About This Presentation
This lecture on Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs) is designed to give a complete and deep understanding of MOSFET device structure, physics, operation modes, characteristics, and practical applications in modern electronics.
The lecture is delivered by Dr. G. S. Virdi, Ex...
This lecture on Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs) is designed to give a complete and deep understanding of MOSFET device structure, physics, operation modes, characteristics, and practical applications in modern electronics.
The lecture is delivered by Dr. G. S. Virdi, Ex-Chief Scientist at CSIR-Central Electronics Engineering Research Institute (CEERI), Pilani, with extensive 45+ years of R&D experience in microelectronics, semiconductor devices, and digital/analog circuit design.
The content provides clear explanation of MOSFET fundamentals to advanced concepts including:
MOSFET structure and fabrication basics
Enhancement & depletion mode MOSFETs
MOSFET IV characteristics & channel formation
Biasing techniques in amplifier circuits
Small-signal models and design parameters
MOSFET as amplifier and switch
Internal capacitances & high-frequency behavior
CMOS inverter fundamentals & characteristics
This comprehensive lecture is highly beneficial for:
✔ Engineering and Science students (B.Tech, B.E., M.Sc., M.Tech)
✔ Researchers and professionals in electronics and semiconductor field
✔ Learners preparing for advanced nanoelectronics and IC design
This educational resource will be uploaded on SlideShare for global accessibility and knowledge enhancement in the domain of semiconductor electronics.
Size: 2.26 MB
Language: en
Added: Oct 29, 2025
Slides: 86 pages
Slide Content
MOSFETs
Dr.G.S.Virdi
Ex.Chief Scientist
CSIR -Central Electronics Engineering Research Institute
Pilani -333031,India
FET
2
FieldEffectTransistor(FET)
•Theconductivity(orresistivity)ofthepathbetweentwocontacts,the
sourceandthedrain,isalteredbythevoltageappliedtothegate.
–Deviceisalsoknownasavoltagecontrolledresistor.
Dr.G.S.VIRDI
BiasinginMOSAmplifierCircuits
25
BiasingUsingaDrain-to-GateFeedback
Resistor:
•Asimpleandeffectivebiasingarrangementutilizing
afeedbackresistorconnectedbetweenthedrain
andthegateisshowninfigure.
•HerethelargefeedbackresistanceR
G(usuallyin
theMΩrange)forcesthedcvoltageatthegateto
beequaltothatatthedrain(becauseI
G=0).
Thuswecanwrite
V
GS=V
DS=V
DD–R
DI
D
Whichcanberewrittenintheform
V
DD=V
GS+R
DI
D
Dr.G.S.VIRDI
BiasinginMOSAmplifierCircuits
26
•BiasingUsingaDrain-to-GateFeedback
Resistor:
•IfI
Dincreasesduetoanyreason,thenV
GSmust
decrease.
•ThedecreaseinV
GSinturncausesadecreasein
I
D.
•Thusthenegativefeedbackordegeneration
providedbyR
GworkstokeepthevalueofI
Das
constantaspossible.
V
GS= V
DS=V
DD–R
DI
D
V
DD= V
GS+R
DI
D
Dr.G.S.VIRDI
Small-SignalOperationandModels
30
•DCBiasPoint:
•ThedcbiascurrentI
Dcanbefoundbysettingthe
signalv
gstozero;
Thus,
Here,Itisassumedthatλ=0
Here,V
OV=V
GS−V
tistheoverdrivevoltageat
whichtheMOSFETisbiasedtooperate.
Thedcvoltageatthedrain,V
DS,willbe
V
DS= V
DD−R
DI
D
Dr.G.S.VIRDI
Small-SignalOperationandModels
31
•DCBiasPoint:
•Toensuresaturation-region
musthave
V
DS>V
OV
operation,we
•Furthermore,sincethetotalvoltageatthe
drainwillhaveasignalcomponent
superimposedonV
DS,V
DShastobe
sufficientlygreaterthanV
OVtoallowforthe
requirednegativesignalswing.
Dr.G.S.VIRDI
Small-SignalOperationandModels
32
SignalCurrentintheDrainTerminal:
•Considerthesituationwiththeinputsignalv
gs
applied.
•Thetotalinstantaneousgate-to-sourcevoltage
willbe
v
GS=V
GS+v
gs
resultinginatotalinstantaneousdraincurrent
i
D,
dcbiascurrentI
D
currentcomponentthatisdirectlyproportionaltotheinputsignalv
gs
representsnonlineardistortion.
Dr.G.S.VIRDI
Small-SignalOperationandModels
33
•SignalCurrentintheDrainTerminal:
•ToreducethenonlineardistortionintroducedbytheMOSFET,theinput
signalshouldbekeptsmallsothat
resultingin
or,equivalently,
Ifthissmall-signalconditionissatisfied,theni
Dcanbeexpressedas
i
D≈I
D+i
d
where
i
d=k
n(V
GS−V
t)v
gs
Dr.G.S.VIRDI
Small-SignalOperationandModels
34
Theparameterthatrelatesi
dandv
gsistheMOSFETtransconductance
g
m,
orintermsoftheoverdrivevoltageV
OV,
g
m=k
nV
OV
Dr.G.S.VIRDI
Small-SignalOperationandModels
35
shows a•Figure
graphical
ofthe
interpretation
small-signal
operationof the
MOSFETamplifier.
•Notethatg
misequalto
theslopeofthei
D–v
GS
characteristicatthebias
point,
Small-signaloperation
of theMOSFETamplifierDr.G.S.VIRDI
Small-SignalOperationandModels
36
VoltageGain:
•Totalinstantaneousdrainvoltagev
DSasfollows:
v
DS=V
DD−R
Di
D
•Underthesmall-signalcondition,wehave
v
DS=V
DD−R
D(I
D+i
d)
•whichcanberewrittenas
v
DS=V
DS−R
di
d
•Thusthesignalcomponentofthedrainvoltageis
V
ds=−i
dR
D=−g
mv
gsR
D
whichindicatesthatthevoltagegainisgivenby
Theminussignindicates that theoutput signalv
dsis180°outof phasewithrespect
totheinputsignal v
gs.
Conceptualcircuitto
studyoperationofthe
MOSFET
Dr.G.S.VIRDI
MOSFETInternalCapacitances
69
•Similarly,forthedraindiffusion,wehavethedrain-bodycapacitance
C
db,
whereC
db0isthecapacitancevalueatzeroreverse-biasvoltageand
V
DBisthemagnitudeofthisreverse-biasvoltage.Notethatwehave
assumedthatforbothjunctions,thegradingcoefficientm=1/2.
Problem:Forann-channelMOSFETwitht
ox=10nm,L=1.0μm,
W=10μm,L
ov=0.05μm,C
sb0=C
db0=10fF,V
0=0.6V,V
SB=1Vand
V
DS=2V.Calculatethefollowingcapacitanceswhenthetransistoris
operatingin saturation:C
ox,C
ov, C
gs,C
gd,C
sb,andC
db.
Ans:C
ox=3.45fF/μm
2
;
C
gd=1.72fF;
C
ov =1.72fF;
C
sb=6.1fF;
C
gs =24.7fF;
C
db = 4.1fF
Dr.G.S.VIRDI