sem vs tem.pptx

Easier

1. Difference between Sem and Tem: Scanning electron microscope (Sem) Sem stands for Scanning electron microscope SEM creates an image by detecting reflected or knocked-off electrons. Surface of the sample Image is 3 dimensional. The magnification is maximum 2 million . The resolution is 0.4nanometers The medium of SEM is vaccum . Field of view is large Voltage require is high .(50 to 30000). Required less time compared with TEM. Sample can be thick or thin Less preparation sample required Transmission electron microscope (tem) Tem stands for transmission electron microscope. TEM uses transmitted electrons (electrons that are passing through the sample) to create an image. Internal surface of the sample Image is 2 Dimensional The magnification is maximum of 50 million. The resolution is 0.5angstroms The medium of TEM is vaccum Field of view is small Voltage require is low Long process Required more times when compared to SEM Sample can be ultrathin More sample preparation required

2. SEM and TEM:

3. Similarities of Scanning electron microscope and Transmission electron microscope : some similarities between the scanning electron microscope (SEM) and Transmission electron microscope (TEM) are as follows: Object types Source of radiation Medium Nature of lenses Magnification adjustment. Focusing Similarities between SEM and TEM:

4. SEM vs TEM summary of advantages : Both SEMs and TEMs have unique advantages when compared to one another. Compared to TEMs, SEMs cost less to procure, take less time to generate an image, require less time for specimen preparation, accept thicker samples that are much larger. Compared to SEMs, TEMs generate higher-resolution images, provide atomic and crystallographic data, produce 2D images that are easier to interpret than 3D SEM images, and allow users to examine additional characteristics of a given sample.

5. Difference between XRD and SEM XRD XRD stands for X-ray diffraction XRD is limited to small samples, and works best with flat things. SEM SEM stands for Scanning electron microscope SEM-EDS can produce structural information or material composition information. It additionally provides images of the surface of an object at extremely high magnifications. XRD shows particle size of 40 nm SEM reveals particle size of 20 nm SEM is used for particle size. Both are different. XRD is used for crystalline size

6. Difference between XRD and TEM XRD XRD can gives a crystal size distribution related to the millions of diffracted crystals illuminated by X ray during the experiment. TEM TEM is good for morphology scan but it required a quite huge number of images for statistical reliability which is not an easy and cheap thing. From the XRD patterns, you can calculate the average crystallite size b From TEM, you can calculate the particle size.