CONTENTS Introduction History Bragg’s law X-Ray Diffraction Basis of crystallography Seven crystal system Method of X-Ray diffraction Basis features of typical x-ray Application Uses Error Conclusion References
Introduction:- It is a non-destructive analytical techniques used to study the structure, composition and physical properties of materials. Bragg’s law is used to explain the interference pattern of X-rays. It is commonly known as X-ray diffraction or X-ray wave interference.
History:- In 1895 discovery of X-ray production by Willem Roentgen. In 1914 discovery of X-ray diffraction pattern by knipping and Von Laue. In 1915 theory of X-ray diffraction pattern by Bragg.
Bragg’s law λ = 2dsin θ
…………… Crystalline material consist of parallel rows of atoms separated by unique distances. Diffraction occurs when a beam enter a crystalline substance and is scattered. Direction and intensity of diffraction depends on orientation of the crystal lattice with radiation.
DERIVATION Since we know that λ = AB + BC --------(1) But, AB = BC λ = 2 AB --------(2) But, AB = dsin θ --------( 3) From equation (2) we get, λ = 2 ( dsin θ ) λ = 2 dsin θ (by equation (3)) λ = 2 dsin θ This equation is known as Bragg’s equation.
X-RAY DIFFRACTION:- Non distractive analytical technique for identification and quantitative determination of various crystalline from known as phases . Identification is achieved by comparing the X-ray diffraction pattern. The atomic planes of a crystal cause an incident beam of X-ray to interference with one another as they leave the crystal. This phenomenon is called X-ray diffraction.
Fig:- X-ray diffraction
BASIC OF CRYSTALLOGRAPHY:- A crystal consist of periodic arrangement of the unit cell into a lattice . A unit cell can contain a single atom or atom in a fixed rearrangement . A crystal lattice is a regular 3 D distribution of atom in space.
APPLICATION:- It is a non distractive technique. To determine crystalline phases and orientation . To determine the structural properties such as Grain Size Strain Shape Lattice parameters . To determine atomic arrangement.
ERRORS:- Speciment displacement. Errors in zero position. Instrument misalingnment.
CONCLUSION:- Non- destructive, fast, easy sample preparation. High-accuracy for d-spacing calculation. Standard are available for thousand of material systems.