CH04 Wafer Manufacturing and Epitaxy Growing.pdf

fabrication slide

1. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 1
Chapter 4
Wafer Manufacturing
and Epitaxy Growing
Hong Xiao, Ph. D.
[email protected]

2. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 2
Objectives
•Give two reasons why silicon dominate
•List at least two wafer orientations
•List the basic steps from sand to wafer
•Describe the CZ and FZ methods
•Explain the purpose of epitaxial silicon
•Describe the epi-silicon deposition process.

3. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 3
Crystal Structures
•Amorphous
–No repeated structure at all
•Polycrystalline
–Some repeated structures
• Single crystal
–One repeated structure

4. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 4
Amorphous Structure

5. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 5
Polycrystalline Structure
Grain
Grain
Boundary

6. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 6
Single Crystal Structure

7. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 7
Why Silicon?
•Abundant, cheap
•Silicon dioxide is very stable, strong
dielectric, and it is easy to grow in thermal
process.
•Large band gap, wide operation temperature
range.

8. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 8
Name Silicon
Symbal Si
Atomic number 14
Atomic weight 28.0855
Discoverer Jöns Jacob Berzelius
Discovered at Sweden
Discovery date 1824
Origin of name From the Latin word "silicis" meaning "flint"
Bond length in single crystal Si 2.352 Å
Density of solid 2.33 g/cm
3
Molar volume 12.06 cm
3
Velocity of sound 2200 m/sec
Electrical resistivity 100,000 mW×cm
Reflectivity 28%
Melting point 1414 °C
Boiling point 2900 °C
Source: http://www.shef.ac.uk/chemistry/web-elements/nofr-key/Si.html

9. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 9
Unit Cell of Single Crystal Silicon
Si
Si
Si
Si
Si

10. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 10
Crystal Orientations: <100>
x
y
z
<100> plane

11. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 11
Crystal Orientations: <111>
x
y
z
<100> plane
<111> plane

12. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 12
Crystal Orientations: <110>
x
y
z
<110> plane

13. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 13
<100> Orientation Plane
AtomBasic lattice cell

14. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 14
<111> Orientation Plane
Silicon atomBasic lattice cell

15. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 15
<100> Wafer Etch Pits

16. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 16
<111> Wafer Etch Pits

17. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 17
Illustration of the Defects
Silicon AtomImpurity on substitutional site
Frenkel DefectVacancy or Schottky Defect
Impurity in
Interstitial Site
Silicon
Interstitial

18. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 18
Dislocation Defects

19. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 19
From Sand to Wafer
•Quartz sand: silicon dioxide
•Sand to metallic grade silicon (MGS)
•React MGS powder with HCl to form TCS
•Purify TCS by vaporization and condensation
•React TCS to H
2
to form polysilicon (EGS)
•Melt EGS and pull single crystal ingot

20. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 20
From Sand to Wafer (cont.)
•Cut end, polish side, and make notch or flat
•Saw ingot into wafers
•Edge rounding, lap, wet etch, and CMP
•Laser scribe
•Epitaxy deposition

21. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 21
From Sand to Silicon
Heat (2000 °C)
SiO
2
+ C ®
Si + CO
2
Sand Carbon MGS Carbon Dioxide

22. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 22
Silicon Purification I
Si + HCl
® TCS
Silicon
Powder
Hydrochloride
Filters
Condenser
Purifier
Pure TCS with
99.9999999%
Reactor,
300 °C

23. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 23
Polysilicon Deposition, EGS
Heat (1100 °C)
SiHCl3 + H2 ® Si + 3HCl
TCS Hydrogen EGS Hydrochloride

24. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 24
Silicon Purification II
Liquid
TCS
H
2
Carrier gas
bubbles
H
2
and TCS
Process
Chamber
TCS+H
2
®EGS+HCl
EGS

25. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 25
Electronic Grade Silicon
Source: http://www.fullman.com/semiconductors/_polysilicon.html

26. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 26
Crystal Pulling: CZ method
Graphite Crucible
Single Crystal
silicon Ingot
Single Crystal Silicon Seed
Quartz Crucible
Heating Coils
1415 °C
Molten Silicon

27. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 27
CZ Crystal Pullers
Mitsubish Materials Silicon
Source: http://www.fullman.com/semiconductors/_crystalgrowing.html

28. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 28
CZ Crystal Pulling
Source: http://www.fullman.com/semiconductors/_crystalgrowing.html

29. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 29
Floating Zone Method
Heating
Coils
Poly Si
Rod
Single Crystal
Silicon
Seed Crystal
Heating Coils
Movement
Molten Silicon

30. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 30
Comparison of the Two Methods
•CZ method is more popular
–Cheaper
–Larger wafer size (300 mm in production)
–Reusable materials
•Floating Zone
–Pure silicon crystal (no crucible)
–More expensive, smaller wafer size (150 mm)
–Mainly for power devices.

31. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 31
Ingot Polishing, Flat, or Notch
Flat, 150 mm and smallerNotch, 200 mm and larger

32. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 32
Wafer Sawing
Orientation
Notch
Crystal Ingot
Saw Blade
Diamond Coating
Coolant
Ingot
Movement

33. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 33
Parameters of Silicon Wafer
Wafer Size (mm) Thickness (mm) Area (cm
2
) Weight (grams)
279 20.26 1.32
381 45.61 4.05
100 525 78.65 9.67
125 625 112.72 17.87
150 675 176.72 27.82
200 725 314.16 52,98
300 775 706.21 127.62
50.8 (2 in)
76.2 (3in)

34. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 34
Wafer Edge Rounding
Wafer
Wafer movement
Wafer Before Edge Rounding
Wafer After Edge Rounding

35. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 35
Wafer Lapping
•Rough polished
•conventional, abrasive, slurry-lapping
•To remove majority of surface damage
•To create a flat surface

36. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 36
Wet Etch
•Remove defects from wafer surface
•4:1:3 mixture of HNO
3
(79 wt% in H
2
O),
HF (49 wt% in H
2
O), and pure CH
3
COOH.
•Chemical reaction:
3 Si + 4 HNO
3 + 6 HF ® 3 H
2SiF
6 + 4 NO + 8 H
2O

37. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 37
Chemical Mechanical Polishing
Slurry
Polishing Pad
Pressure
Wafer Holder
Wafer

38. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 38
200 mm Wafer Thickness and
Surface Roughness Changes
76 mm
914 mm
After Wafer Sawing
After Edge Rounding
76 mm
914 mm
12.5 mm
814 mm
<2.5 mm
750 mm
725 mm
Virtually Defect Free
After Lapping
After Etch
After CMP

39. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 39
Epitaxy Grow
•Definition
•Purposes
•Epitaxy Reactors
•Epitaxy Process

40. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 40
Epitaxy: Definition
•Greek origin
•epi: upon
•taxy: orderly, arranged
•Epitaxial layer is a single crystal layer on a
single crystal substrate.

41. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 41
Epitaxy: Purpose
•Barrier layer for bipolar transistor
–Reduce collector resistance while keep high
breakdown voltage.
–Only available with epitaxy layer.
•Improve device performance for CMOS and
DRAM because much lower oxygen,
carbon concentration than the wafer crystal.

42. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 42
Epitaxy Application, Bipolar
Transistor
n-Epi
p n
+
n
+
P-substrate
Electron flow
n
+
Buried Layer
p
+
p
+
SiO
2
Al•Cu•Si
BaseCollectorEmitter

43. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 43
Epitaxy Application: CMOS
P-Wafer
N-Well
P-Well
STI
n
+
n
+
USG
p
+
p
+
Metal 1, Al•Cu
BPSG
W
P-type Epitaxy Silicon

44. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 44
Silicon Source Gases
Silane SiH
4
DichlorosilaneDCS SiH
2
Cl
2
TrichlorosilaneTCS SiHCl
3
Tetrachlorosilane SiCl
4

45. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 45
Dopant Source Gases
Diborane B
2
H
6
Phosphine PH
3
Arsine AsH
3

46. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 46
DCS Epitaxy Grow, Arsenic Doping
Heat (1100 °C)
SiH
2
Cl
2
® Si + 2HCl
DCS Epi Hydrochloride
AsH
3
® As + 3/2 H
2
Heat (1100 °C)

47. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 47
Schematic of DCS Epi Grow and
Arsenic Doping Process
SiH
2
Cl
2
Si
AsH
3
As
AsH
3
H
HCl
H
2

48. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 48
Epitaxial Silicon Growth Rate Trends
Growth Rate, micron/min
1000/T(K)
Temperature (°C)
0.7 0.8 0.9 1.0 1.1
0.01
0.02
0.05
0.1
0.2
0.5
1.0
1300120011001000900 800 700
SiH
4
SiH
2
Cl
2
SiHCl
3
Surface reaction limited
Mass transport
limited

49. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 49
Barrel Reactor
Radiation
Heating
Coils
Wafers

50. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 50
Vertical Reactor
Heating
Coils
Wafers
Reactants
Reactants and
byproducts

51. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 51
Horizontal Reactor
Heating Coils
Wafers
Reactants
Reactants and
byproducts

52. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 52
Epitaxy Process, Batch System
•Hydrogen purge, temperature ramp up
•HCl clean
•Epitaxial layer grow
•Hydrogen purge, temperature cool down
•Nitrogen purge
•Open Chamber, wafer unloading, reloading

53. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 53
Single Wafer Reactor
•Sealed chamber, hydrogen ambient
•Capable for multiple chambers on a mainframe
•Large wafer size (to 300 mm)
•Better uniformity control

54. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 54
Single Wafer Reactor
Heating Lamps
Heat
Radiation
Wafer
Quartz
Window
Reactants
Reactants &
byproducts
Quartz
Lift
Fingers
Susceptor

55. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 55
Epitaxy Process, Single Wafer
System
•Hydrogen purge, clean, temperature ramp up
•Epitaxial layer grow
•Hydrogen purge, heating power off
•Wafer unloading, reloading
•In-situ HCl clean,

56. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 56
Why Hydrogen Purge
•Most systems use nitrogen as purge gas
•Nitrogen is a very stable abundant
•At > 1000 °C, N
2
can react with silicon
•SiN on wafer surface affects epi deposition
•H
2
is used for epitaxy chamber purge
•Clean wafer surface by hydrides formation

57. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 57
Properties of Hydrogen
Name Hydrogen
Symbol H
Atomic number 1
Atomic weight 1.00794
Discoverer Henry Cavendish
Discovered at England
Discovery date 1766
Origin of name From the Greek words "hydro" and "genes" meaning
"water" and "generator"
Molar volume 11.42 cm
3
Velocity of sound 1270 m/sec
Refractive index 1.000132
Melting point -258.99 C
Boiling point -252.72 C
Thermal conductivity 0.1805 W m
-1
K
-1

58. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 58
Defects in Epitaxy Layer
Dislocation
Stacking Fault from
Surface Nucleation
Impurity Particle
Hillock
Stacking Fault form
Substrate Stacking Fault
After S.M. Zse’s VLSI Technology
Substrate
Epi Layer

59. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 59
Future Trends
•Larger wafer size
•Single wafer epitaxial grow
•Low temperature epitaxy
•Ultra high vacuum (UHV, to 10
-9
Torr)
•Selective epitaxy

60. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 60
Summary
•Silicon is abundant, cheap and has strong,
stable and easy grown oxide.
•<100> and <111>
•CZ and floating zone, CZ is more popular
•Sawing, edging, lapping, etching and CMP

61. Hong Xiao, Ph. D. www2.austin.cc.tx.us/HongXiao/Book.htm 61
Summary
•Epitaxy: single crystal on single crystal
•Needed for bipolar and high performance
CMOS, DRAM.
•Silane, DCS, TCS as silicon precursors
•B
2
H
6
as P-type dopant
•PH
3
and AsH
3
as N-type dopants
•Batch and single wafer systems