SAP MII 14.0 - OEE Overview PM Equipment Effectiveness

VagnerMarmentini 54 views 10 slides Jul 11, 2024
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About This Presentation

OEE


Slide Content

March 2012
OEE Overview

©2011 SAP AG. All rights reserved. 2
Legal Disclaimer
The information in this presentation is confidential and proprietary to SAP and may not be disclosed
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All forward-looking statements are subject to various risks and uncertainties that could cause actual
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upon in making purchasing decisions.

©2011 SAP AG. All rights reserved. 3
Overall Equipment Effectiveness
Overview – First Step to Plant Performance Management
Value Added for Customer

Reduced manufacturing cost through waste reduction
Maximized return on capital investment by improving asset
utilization
Increased customer satisfaction by constant monitoring on
Speed of Production and Quality
Continuous improvement of manufacturing performance
Operator friendly UI
Extension possibilities


CUSTOMER VALUE


SHORT DESCRIPTION

Context/Use Case

OEE is a Plant Performance Management Solution with:
Universally accepted set of metrics in manufacturing
Clear focus to the key success drivers for manufacturing
enterprises (Quality, Availability and Performance)
Analytical capabilities to analyze the root causes for
performance losses

©2011 SAP AG. All rights reserved. 4
Master Data and Configurations
Model the Factory – Plant / Line / Work Center / Machine / Machine Groups
Factory Calendar & Shift Patterns, Reporting periods*
Reason Codes, Machine States & Categories, Machine Events
Standard Cycle Times

Transaction data and data collections
Data Collection for Machine Downtimes, Production Quantities & Good/Bad Quantities
(Automatic / Manual data entry in shop floor UI templates)
Operator grade screen for data collection and monitoring

Reporting and Analytics
Calculation of KPI’s
 Analytic Dashboards
Drilldown Capabilities for root cause analysis

 Enable extensions of the solution


Overall Equipment Effectiveness
Business Requirements

©2011 SAP AG. All rights reserved. 5
Overall Equipment Efficiency on HANA
Architecture Overview
Central repository
enables global
visibility with full
drill-down
Use of raw data
instead of complex
aggregation and
synch mechanisms
Real-time execution
of complex KPI
calculation
algorithms
Direct machine
connectivity to
collect status
information etc
Data buffering at
plant level through
MII/PCo

©2011 SAP AG. All rights reserved. 6
Overall Equipment Effectiveness
Operator Dashboard
 Real time calculations for the current Order
 Real time OEE calculations happens in HANA
Custom / Extensible
Operator Menu
Collapsible SAP
provided Operator
Menu
Possible Integration
with MII 14.0 Alert
Framework
Line Status
Machine Status

©2011 SAP AG. All rights reserved. 7
Overall Equipment Effectiveness
Solution Architecture SAP MANUFACTURING INTEGRATION & INTELLIGENCE (MII 14.0)
ON SAP NETWEAVER 7.3 JAVA STACK
Shop Floor User (SAPUI5)
OEE MII Content
R
Servlet Dispatcher (oData – JSON)
-- Protocol translation and call dispatcher
R
Netweaver Database
CVOM Chart Specific
Data Translator
R
R
SAPUI5 Pages with Client Side Rendering
Configuration Pages Operator UI
Analytic Dashboard
(CVOM usage)
R
HANA
OEE HANA Content
R
JDBC
Analytics User (SAPUI5)
R
Producing/
Down Status
History
Production
Quantities
PCo
Procedures
Analytic Views
Column Views
ERP
OEE Master Data &
Configurations
R
IDOC
MII RFC/EDI
Adapter
SAP Manufacturing
Execution (SAP ME)
OPTIONAL R
Events
MII Transactions
Data
Replicator
Event
Dispatch
R
API Layer
Event
Dispatch
Configuration,
Orders
R
HANA
Content
Access
R

©2011 SAP AG. All rights reserved. 8
Where are the gaps to the solution expected by Nestlé
High level solution approach with standard OEE is aligned
Needs more analysis of the RFP to detail the differences
But there are some differences in finer detail level which may be solved with further
clarifications – certain requirements in the RFP requires clarifications. E.g.,
Nestle prefers calendar and shift maintenance at plant level not central at ECC
Multi resources and Material specific bottleneck

Who is responsible for what in the solution?
Sumanta – Product Owner for OEE solution
Veronika – Overall Manufacturing responsible
Solution team complete?
Development team in Labs Bangalore – 7 developers
Issues and challenges?
 Team is new
Working with all new technologies which are still in the process of maturing ( HANA, UI5 etc)
Work load is high due to large customer association and their high expectations




Overall Equipment Effectiveness
High level Comparison with Nestle Requirements

©2011 SAP AG. All rights reserved. 9
Overall Equipment Efficiency (OEE) on HANA

Leverage immediately the power of In-Memory for analytics for OEE
HANA provides the best environment for OEE from a technical perspective:
A combination of data aggregation mechanisms with business logic & algorithms. It allows flexible drill
down capabilities from the top aggregated level down to the individual record.
No intermediate step on classical DB, no future migration for customers
With HANA customers can easily build additional manufacturing analytics on top of OEE
Provide one tool & user experience for both enterprise and plant reporting based on up-to-date
technologies
HANA will be the basis for future real time and predictive operational intelligence
OEE is the first step towards an In-Memory Manufacturing Performance Management solution
Real time and predictive Analytics will be further steps leveraging the power of HANA to allow improved
process yield, resource consumption, product and process quality through real-time monitoring of
production performance



Build OEE directly on In-Memory is the first step towards a new era of
Manufacturing Analytics and Operational Intelligence
KEY MESSAGE

Thank You!
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