VJ_Single_Electron_chapter1__Devices.ppt

ssusere1391d1 7 views 20 slides Jun 03, 2024
Slide 1
Slide 1 of 20
Slide 1
1
Slide 2
2
Slide 3
3
Slide 4
4
Slide 5
5
Slide 6
6
Slide 7
7
Slide 8
8
Slide 9
9
Slide 10
10
Slide 11
11
Slide 12
12
Slide 13
13
Slide 14
14
Slide 15
15
Slide 16
16
Slide 17
17
Slide 18
18
Slide 19
19
Slide 20
20

About This Presentation

Single electron device electronic circuits and devices presentation


Slide Content

Single Electron Devices
Vishwanath Joshi
Advanced Semiconductor Devices
EE 698 A

Outline
Introduction
Single Electron (SE) Transistor
SE Turnstiles
SE Pump
SE Inverters
Metal, Semiconductor, Carbon nano-tube
SE Memory

Introduction
Devices that can control the motion of even a
single electron
Consist of quantum dots with tunnel junctions
Simplest device
Single electron box

Single electron box
Conditions for observing single electron
tunneling phenomena
E
c> k
bT
E
c= e
2
/2C
Σ
R
t> R
k
R
k= h/e
2
(25.8 KOhms)

Single electron transistor
3 terminal switching device
Current flows when V
g= ne/2C
g

Turnstile
Single electron is transferred per cycle of an
external RF signal
ΔE
k= -e(|Q|
k–Q
ck)/C
k
Q
ck= e(1+C
ek/C
k)/2
Cek = capacitance of circuit in parallel with junction k
Ck = junction capacitance
Frequency Locked Turnstile Device for Single Electrons, Physical Review Letters,
Vol 64(22), 28 May 1990, 2691

Pumps
Accuracy of electron counting using a 7-junction electron pump, Applied Physics
Letters, Vol 69 (12), 16 Sept 1996, 1804

Pumps (contd.)
Al/Al
2O
3structures have limited operational
temperature and poor operational stability
Si-based SETs operate at higher temperature
Place MOSFETs near SET –control of
channels
Electron pump by combined single-electron/field effect transistor structure, Applied
Physics Letters, Vol 82 (8), 24 Feb 2003, 1221

Fabrication
Fabricated on SOI substrate using standard
MOS process
Formation of Si island by PADOX method
Dual gates made of Phosphorous doped
poly-Si are defined
Again deposit Phosphorous doped poly-Si
and define a broad gate covering entire
pattern

Measurements
Measurements at 25 K
V
thof MOSFET1 = 0.3V
V
thof MOSFET2 =-0.2V

Charge Coupled Device
30 nm wide Si-wire channel and poly-Si gates
defined by E-beam lithography
Current quantization due to single electron transfer in Si-wire charge coupled
device, Applied Physics Letters, Vol 84 (8), 23 Feb 2004, 1323

Si SE Inverter
Twin Si single electron islands are formed by
V-PADOX
Si complementary single-electron inverter with voltage gain, Applied Physics
Letters, Vol 76 (21), 22 May 2000, 3121

SE Inverter (contd.)
Working of Inverter

Si SE Inverter (contd.)

Al/Al
2O
3SE Inverter
25 nm thick Al patterned to form the lower
electrodes
Al oxidized in an O
2plasma, 200 mTorr, 5
min, 200
o
C
Second Al deposition
Single-electron inverter, Applied Physics Letters, Vol 78 (5), 19 Feb 2001, 1140

Al/Al
2O
3SE Inverter (contd.)
Working of Inverter

SE Inverter from carbon nanotubes
Fabrication of single-electron inverter in multiwall carbon nanotubes, Applied
Physics Letters, Vol 82 (19), 12 May 2003, 3307
Tunnel barriers fabricated with the local
irradiation of an Ar beam

SE Inverter from carbon nanotubes
(contd.)
Working of the Inverter

Memory

References
Frequency Locked Turnstile Device for Single Electrons, Physical
Review Letters, Vol 64(22), 28 May 1990, 2691
Accuracy of electron counting using a 7-junction electron pump, Applied
Physics Letters, Vol 69 (12), 16 Sept 1996, 1804
Electron pump by combined single-electron/field effect transistor
structure, Applied Physics Letters, Vol 82 (8), 24 Feb 2003, 1221
Current quantization due to single electron transfer in Si-wire charge
coupled device, Applied Physics Letters, Vol 84 (8), 23 Feb 2004, 1323
Si complementary single-electron inverter with voltage gain, Applied
Physics Letters, Vol 76 (21), 22 May 2000, 3121
Single-electron inverter, Applied Physics Letters, Vol 78 (5), 19 Feb
2001, 1140
Fabrication of single-electron inverter in multiwall carbon nanotubes,
Applied Physics Letters, Vol 82 (19), 12 May 2003, 3307
A high-speed silicon single-electron random access memory, IEEE
Electron Device Letters, Vol. 20, No. 11, November 1999, 583
Tags