VLSI Fabrication Process in detail pdf file

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About This Presentation

VLSI for UG and PG


Slide Content

Introduction
t
o
VLSI Fabrication Technologies
27/09/2005
Emanuele
B
aravelli

2
Organization

Materials
U
sed
in VLSI Fabrication

VLSI Fabrication
T
echnologies

Overview
of Fabrication
M
ethods

Device
simulation

3
Main
Categories
o
f Materials
Materials
c
an be
classified
into
three
m
ain
groups
r
egarding
their
e
lectrical
conduction
properties: „
Insulators

Conductors

Semiconductors

4
Conductors
Conductors
a
re used
in IC design for
e
lectrical
connectivity. The following
are good
conducting
elements: „
Silver

Gold

Copper

Aluminum

Platinum

5
Insulators
Insulators
are used
to
isolate conducting
and/or
semi-conducting
materials
f
rom
e
ach
o
ther.
MOS devices
and Capacitors
r
ely
on an
insulator
f
or
their
physical
operation.
The choice
of the insulators
(and the conductors)
in IC design depends
heavily
on how
t
he materials
interact
with
each
o
ther, especially
with
the
semiconductors.

6
Semiconductors

The basic semiconductor material used
in device
fabrication
is
Silicon

The success of this
material is
due to:

Phisical
c
haracteristics

Abundance in nature and very low cost

Relatively easy process

Reliable high volume fabrication

Other
s
emiconductors
(e.g. GaAs) are used
for
s
pecial applications

7
Organization

Materials
U
sed
in VLSI Fabrication

VLSI Fabrication
T
echnologies

Overview
of Fabrication
M
ethods

Device
simulation

8
Overview
of Processing
Technologies
Although
a
number
of processing technologies
a
re
available, the majority of the production is
done
with
traditional
C
MOS. Other
processes
a
re limited
to
areas
where
C
MOS is
not
very
suitable
(like
h
igh speed
R
F applications)
B
i
pola
r
:
2%
S
O
I:
1
%
Ga
A
s
:
2
%
C
M
O
S
:
90%
Bi
CM
O
S
:

5%

9
CMOS technology

An
Integrated Circuit (IC)
is an
electronic network fabricated in a single piece of a semiconductor material

The semiconductor surface is subjected to various processing steps in which impurities and other materials are added with specific geometrical patterns

The fabrication steps are sequenced to form three dimensional regions that act as transistors and interconnects that form the network

10
Simplified
View
of MOSFET

11
CMOS Process
The CMOS process
a
llows
f
abrication
of nMOS
and pMOS
transistors
s
ide-by-side
on the same
Silicon
substrate.

12
Organization

Materials
U
sed
in VLSI Fabrication

VLSI Fabrication
T
echnologies

Overview
of Fabrication
M
ethods

Device
simulation

13
Fabrication process sequence

Silicon manifacture

Wafer processing

Lithography

Oxide growth and removal

Diffusion and ion implantation

Annealing

Silicon deposition

Metallization

Testing

Assembly and packaging

14
Single Crystal
Growth
(I)

Pure silicon
is
m
elted
in a
pot (1400
º
C) and a small
seed
containing
the
desired
crystal
o
rientation
is
inserted
into
molten
silicon
and slowly
(1mm/minute) pulled
out.

15
Single Crystal
Growth
(II)

The silicon
crystal
(
in some
cases
a
lso
c
ontaining
d
oping)
is
manufactured
a
s
a
cylinder
(
ingot
) with
a diameter
of
8-12 inches
(1”=2.54
cm).

This
cylinder
is
carefully
sawed
into
t
hin
(
0.50-0.75
mm thick) disks
c
alled
wafers
, which
a
re later
polished
and marked
for
crystal
orientation.

16
Lithography
(
I)
Lithography
: process used to transfer patterns to
each layer of the IC Lithography sequence steps: „
Designer
:

Drawing the “layer” patterns on a layout editor

Silicon Foundry
:

Masks generation from the layer patterns in the design data base

Printing: transfer the mask pattern to the wafer surface

Process the wafer to physically pattern each layer of the IC

17
Lithography
(
II)
1.
Photoresist
a
pplication:

the surface to be patterned is spin-coated with a light-sens
itive
organic poly
m
er called photoresist
2.
Printing (exposure):

the mask pattern is developed on the photoresist, with UV light expos
ure

depending on the ty
pe of photoresist
(negative or positive), the expos
ed or
unexposed parts become resistant to certain types of solv
ents
3.
Development:

the soluble photoresist
is chemically
removed

The developed photoresist
acts
as a mask
for patterning of underly
ing layers and
then is removed.
1.
Phot
oresi
st
coat
i
n
g
Si
O
2
Phot
o
r
es
is
t
Sub
s
t
r
at
e
3.
Devel
opment
Sub
s
t
r
at
e
Sub
s
t
r
at
e
Ma
sk
Ult
r
a v
iolet
l
ight
O
p
a
que
Expose
d
Unex
pos
ed
2. E
x
po
s
u
re

18
Oxide
G
rowth
/
Oxide
D
eposition

Oxide can be
grown
from silicon
through heating in an oxidizing atmosphere

Gate oxide, device isolation

Oxidation consumes silicon

SiO
2
is
deposited
on materials other than silicon
through reaction between gaseous silicon compounds and oxidizers

Insulation between different
layers of metallization
X
FO
X
0.54
X
FO
X
0.46
X
FO
X
Si
licon waf
e
r
S
ilic
o
n
s
u
r
f
a
c
e
Fi
el
d oxi
d
e

19
Etching

Once the desired shape is patterned with photoresist, the
etching
process
allows unprotected materials to be removed

Wet etching
: uses chemicals

Dry or plasma etching
: uses ionized
gases

20
Diffusion
a
nd Ion
I
mplantation
Doping materials
a
re added
to
change
t
he electrical
characteristics
of silicon
locally
through:

Diffusion
: dopants
deposited on silicon
move through the lattice by thermal diffusion (high temperature process)

Wells

Ion implantation
: highly energized
donor or acceptor atoms impinge on the surface and travel below it

The patterned SiO
2
serves as an
implantation mask

Source and Drain regions

21
Annealing
Thermal annealing
is a high temperature
process which: „
allows doping impurities to diffuse further into the bulk

repairs lattice damage caused by the collisions with doping ions

22
Silicon Deposition and Metallization „
Films of silicon can be added on the surface of a wafer

Epitaxy
: growth
of a single-crystal
semiconductor film on a crystalline substate

Polysilicon
: polycrystalline film
with a granular structure obtained through deposition
of silicon on an
amorphous material

MOSFET gates

Metallization: deposition of metal layers by evaporation

interconnections

23
Advanced CMOS processes

Shallow trench isolation

source-drain halos (series resistance)

Self-aligned silicide (spacers)


n-wel
l
p+
p+
n+
n+
p
-
do
pi
n
g
n-d
oping
S
ilic
ide
Oxi
d
e spa
c
er
n+ po
ly
p+
po
ly
Sh
allow
-
tren
ch iso
latio
n
p
-
typ
e
substrate
Source-dr
a
in
ext
e
n
s
io
n

24
Organization

Materials
U
sed
in VLSI Fabrication

VLSI Fabrication
T
echnologies

Overview
of Fabrication
M
ethods

Device
simulation

25
MOS device simulation

2D 0.18 µm n-channel
MOS, tox
=
4 nm

Id
(Vds) simulation, Vgs=1.3V

8 re
finement
cycles

Refinement
on
ψ
,
n ,
p

26
Research
activities

Geometrical
issues:

Sophisticated 2D geometries
(2nd generation
wavelets)

3D geometries

Simulation
issues:

Advanced
m
odels
(hydrodynamic, quantum effects)

27
Links

http://humanresources.web.cern.ch/Humanresources/ external/training/tech/special/ELEC2002/ ELEC-2002_11Apr02_3.ppt

http://lsmwww.epfl.ch/Education/

http://lsiw
w
w.epfl.ch/LSI2001/teaching/webcourse/toc.
html

www.latticepress.com/prologvol1.html
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